About this scholarly article

SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Laser detection and orientation technology based on conical mirror interference field by Wang, Lian-fen; Hou, Xun; Yuan, Jiahu; Yang, Zhi-ling; Cheng, Ren-song; Wyant, James C.; Wang, Hexin; Li, Zheng-liang; Han, Sen is a scholarly article available to read on EtoBox.

Author

Wang, Lian-fen; Hou, Xun; Yuan, Jiahu; Yang, Zhi-ling; Cheng, Ren-song; Wyant, James C.; Wang, Hexin; Li, Zheng-liang; Han, Sen

Publisher

SPIE

Published

2006

Language

EN