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Inductively Coupled Plasma Reactive Ion Etching of Titanium Nitride Thin Films in A CL 2/ar Plasma by jihoon92kk is a document available to read on EtoBox.

The document discusses the inductively coupled plasma reactive ion etching of titanium nitride (TiN) thin films using a Cl2/Ar plasma. It investigates the effects of various etch parameters, including gas concentration, coil rf power, dc-bias voltage, and gas pressure on etch rates and profiles. The study concludes that optimized conditions lead to high anisotropic etching without redeposition, making TiN films suitable for microelectronics applications.

Author
jihoon92kk
Language
EN