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About this scholarly article
Proceedings of the 44th annual southeast regional conference on - ACM-SE 44 - Automatic quality assessment of Affymetrix GeneChip data by Heber, Steffen; Sick, Beate is a scholarly article available to read on EtoBox.
- Author
- Heber, Steffen; Sick, Beate
- Publisher
- ACM Press
- Published
- 2006
- Language
- EN