About this scholarly article

International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Comparison of E and 1/E TDDB models for SiO/sub 2/ under long-term/low-field test conditions by McPherson, J.; Reddy, V.; Banerjee, K.; Huy Le, is a scholarly article available to read on EtoBox.

Author

McPherson, J.; Reddy, V.; Banerjee, K.; Huy Le,

Publisher

IEEE

Published

1998

Language

EN