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About this Engineering article

Heavy-Ion Induced Single Event Upsets in a Bipolar Logic Device by Kolasinski, W. A.; Koga, R.; Chenette, D. L. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Kolasinski, W. A.; Koga, R.; Chenette, D. L.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
Published
1983
Language
EN
Field
Engineering (Physical Sciences)

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