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About this Engineering article
RF characterisation of fully depleted SOI MOSFET with Si substrate removed by Chen, C.L.; Burns, J.A.; Warner, K.; Beard, W.T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chen, C.L.; Burns, J.A.; Warner, K.; Beard, W.T.
- Publisher
- The Institution of Electrical Engineers; Institution of Electrical Engineers; Institute of Electrical Engineers; Institution of Engineering and Technology (IET) (ISSN 0013-5194)
- Published
- 2002
- Field
- Engineering (Physical Sciences)
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