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About this Engineering article
Oxide thin-film transistors fabricated on polyimide film: Bending stability and electrical properties by Nakata, Mitsuru; Tsuji, Hiroshi; Motomura, Genichi; Nakajima, Yoshiki; Takei, Tatsuya; Fujisaki, Yoshihide; Shimidzu, Naoki; Yamamoto, Toshihiro is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Nakata, Mitsuru; Tsuji, Hiroshi; Motomura, Genichi; Nakajima, Yoshiki; Takei, Tatsuya; Fujisaki, Yoshihide; Shimidzu, Naoki; Yamamoto, Toshihiro
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0093-9994)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)