Opening book details…
About this Engineering article
Scan BIST with biased scan test signals by Dong Xiang; MingJing Chen; JiaGuang Sun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Dong Xiang; MingJing Chen; JiaGuang Sun
- Publisher
- Science in China Press (SCP); Springer-Verlag; Zhongguo Kexue Zazhishe/Science in China Press; Springer Science and Business Media LLC; Science China Press., Co. Ltd. (ISSN 1674-733X)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)