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About this Engineering article
The Effect of Gate Mesh Electrode Strain on Performance of Cold Cathode Electron Beam by Kang, Jung Su; Yoo, Sung Tae; Bin Ihm, Yi; Park, Kyu Chang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kang, Jung Su; Yoo, Sung Tae; Bin Ihm, Yi; Park, Kyu Chang
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2019
- Field
- Engineering (Physical Sciences)