About this scholarly article

2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Fault localization of IDDQ failure using External trigger Synchronous LIT technique by Matsui, Nakaba; Oka, Yasushi; Tominaga, Shinpei; Uchikado, Akihito is a scholarly article available to read on EtoBox.

Author

Matsui, Nakaba; Oka, Yasushi; Tominaga, Shinpei; Uchikado, Akihito

Publisher

IEEE

Published

2020