Skip to content

Opening book details…

About this Materials Science article

Small angle X-ray scattering and electrical resistivity measurements on an Al–2Li–5Mg–0.1Zr alloy by C.T. Truong; O. Kabisch; W. Gille; U. Schmidt is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
C.T. Truong; O. Kabisch; W. Gille; U. Schmidt
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0254-0584)
Published
2002
Field
Materials Science (Physical Sciences)

More by C.T. Truong; O. Kabisch; W. Gille; U. Schmidt

Browse all works by C.T. Truong; O. Kabisch; W. Gille; U. Schmidt