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About this scholarly article
16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) - Fault diagnosis aware ATE assisted test response compaction by Howard, J. M.; Reddy, S. M.; Pomeranz, I.; Becker, B. is a scholarly article available to read on EtoBox.
- Author
- Howard, J. M.; Reddy, S. M.; Pomeranz, I.; Becker, B.
- Publisher
- IEEE
- Published
- 2011
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