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About this Physics and Astronomy article

Modeling of light-induced degradation due to Cu precipitation in p-type silicon. II. Comparison of simulations and experiments by Vahlman, H.; Haarahiltunen, A.; Kwapil, W.; Schön, J.; Inglese, A.; Savin, H. is a Physics and Astronomy article available to read on EtoBox.

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Author
Vahlman, H.; Haarahiltunen, A.; Kwapil, W.; Schön, J.; Inglese, A.; Savin, H.
Publisher
American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
Published
2017
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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