About this scholarly article

SPIE Proceedings [SPIE Singapore - Singapore (Monday 22 October 1990)] Optical Fabrication and Testing - Minideflectometer for measuring optical finish quality by van Amstel, Willem D.; Baumer, Stefan M. B.; Couweleers, Fred C. M.; Lorenzen, Manfred; Campbell, Duncan R. J.; Johnson, Craig is a scholarly article available to read on EtoBox.

Author

van Amstel, Willem D.; Baumer, Stefan M. B.; Couweleers, Fred C. M.; Lorenzen, Manfred; Campbell, Duncan R. J.; Johnson, Craig

Publisher

SPIE

Published

1999

Language

EN