About this document
AI Framework for Semiconductor Burn-In by sudarshanainwad10 is a document available to read on EtoBox.
The documents discuss advancements in semiconductor manufacturing and digital twin technology. The first paper presents an AI-based framework to reduce burn-in testing costs by estimating production lot quality using various data sources and machine learning techniques. The second paper explores the establishment of digital twin standards for Chemical Mechanical Planarization (CMP) in advanced packaging, emphasizing the need for mechanism-based metrology to enhance process understanding and reduce costs.
- Author
- sudarshanainwad10
- Language
- EN