About this scholarly article

2009 International Symposium on VLSI Design, Automation and Test - Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition by Shih-Hung Chen, ; Ker, Ming-Dou is a scholarly article available to read on EtoBox.

Author

Shih-Hung Chen, ; Ker, Ming-Dou

Publisher

IEEE

Published

2009

Language

EN