About this scholarly article

2010 IEEE International Reliability Physics Symposium - A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface by Wang, Szu-Yu; Lue, Hang-Ting; Hsu, Tzu-Hsuan; Du, Pei-Ying; Lai, Sheng-Chih; Hsiao, Yi-Hsuan; Hong, Shih-Ping; Wu, Ming-Tsung; Hsu, Fang-Hao; Lian, Nan-Tzu; Lu, Chi-Pin; Hsieh, Jung-Yu; Yang, Ling-Wu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Lu, Chih-Yuan is a scholarly article available to read on EtoBox.

Author

Wang, Szu-Yu; Lue, Hang-Ting; Hsu, Tzu-Hsuan; Du, Pei-Ying; Lai, Sheng-Chih; Hsiao, Yi-Hsuan; Hong, Shih-Ping; Wu, Ming-Tsung; Hsu, Fang-Hao; Lian, Nan-Tzu; Lu, Chi-Pin; Hsieh, Jung-Yu; Yang, Ling-Wu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Lu, Chih-Yuan

Publisher

IEEE

Published

2010

Language

EN