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About this Engineering article
A Micro-Quantitative AES Analysis Using SEM-SAM Apparatus (Applied to Ag/Si Interfaces on Si(111) and Si(100) Surfaces) by Tokutaka, Heizo; Nishimori, Katsumi; Ishihara, Naganori; Seki, Toshinori is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tokutaka, Heizo; Nishimori, Katsumi; Ishihara, Naganori; Seki, Toshinori
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 1986
- Field
- Engineering (Physical Sciences)
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