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EELS Log-Ratio Method for TEM Thickness by Nisha Pawar is a document available to read on EtoBox.
The document discusses a log-ratio technique for measuring the local thickness of transmission electron microscope specimens using electron energy-loss spectroscopy (EELS). It presents a formula for thickness measurement based on the total and zero-loss areas of the EEL spectrum and provides empirical data on inelastic mean free paths for various materials. The method aims for an accuracy of ±20% in determining specimen thickness, which is crucial for accurate chemical analysis in analytical electron micros
- Author
- Nisha Pawar
- Language
- EN