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About this Engineering article
X-ray diffraction study of cubic-phase AlN thin films grown on sapphire(0001) substrates by pulsed laser deposition by Sumitani, Kazushi; Ohtani, Ryota; Yoshida, Tomohiro; Mohri, Satoshi; Yoshitake, Tsuyoshi is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sumitani, Kazushi; Ohtani, Ryota; Yoshida, Tomohiro; Mohri, Satoshi; Yoshitake, Tsuyoshi
- Publisher
- IOP Publishing (ISSN 1757-8981)
- Published
- 2011
- Field
- Engineering (Physical Sciences)