About this scholarly article

2009 Chinese Control and Decision Conference - Thickness measuring of multilayer conductor based on eddy current testing by Li Guohou, ; Kang Xusheng, ; Huang Pingjie, ; Chen Peihua, ; Hou Dibo, ; Zhang Guangxin, ; Zhou Zekui, is a scholarly article available to read on EtoBox.

Author

Li Guohou, ; Kang Xusheng, ; Huang Pingjie, ; Chen Peihua, ; Hou Dibo, ; Zhang Guangxin, ; Zhou Zekui,

Publisher

IEEE

Published

2009

Language

EN