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About this Engineering article
Contribution of fast and slow states to Negative Bias Temperature Instabilities in HfxSi(1-x)ON/TaN based pMOSFETs by M. Aoulaiche; M. Houssa; R. De graeve; G. Groeseneken; S. De Gendt; M.M. Heyns is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. Aoulaiche; M. Houssa; R. De graeve; G. Groeseneken; S. De Gendt; M.M. Heyns
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0167-9317)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)
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