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Value Analysis Tear-down : a New Process for Product Development and Innovation by Kaufman, J. Jerry; Sato, Yoshihiko is a nonfiction available to read on EtoBox.

What is Value Analysis Tear-down : a New Process for Product Development and Innovation about?

<p>This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer electronics manufacturers. Jerry Kaufman, based in Houston, Texas, is a recognized authority and author on value engineering and value management, and has contributed much that is in these technologies to the process described in this book. The result of his collaboration with Mr. Sato is a process that helps engineers and managers reduce product cost, improve quality, continuously improve existing products, and discover opportunities for innovative change.</p> <p>The first "how-to-do-it" book in English, it is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing execut

Who reads Value Analysis Tear-down : a New Process for Product Development and Innovation?

Author

Kaufman, J. Jerry; Sato, Yoshihiko

Publisher

Industrial Press : Society of Manufacturing Engineers

Published

2005

Language

EN

ISBN

9781615835799

Category

nonfiction

Subjects

Science, Technology, Engineering

Updated

2026-03-24