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About this Engineering article

Micromagnetic Study of Edge-Damage Effects in Perpendicular CoFeB/MgO Magnetic Tunnel Junction by Yoshida, Chikako; Tanaka, Tomohiro; Ataka, Tadashi; Furuya, Atsushi is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Yoshida, Chikako; Tanaka, Tomohiro; Ataka, Tadashi; Furuya, Atsushi
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
Published
2019
Field
Engineering (Physical Sciences)

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