About this Engineering article
Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI) by Sirohi, R. S. ;Burke, J. ;Helmers, H. ;Hinsch, K. D. is a Engineering article available to read on EtoBox.
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- Author
- Sirohi, R. S. ;Burke, J. ;Helmers, H. ;Hinsch, K. D.
- Publisher
- The Optical Society; Optical Society of America (ISSN 1559-128X)
- Published
- 1997
- Field
- Engineering (Physical Sciences)