About this scholarly article

2010 20th International Conference on Pattern Recognition - The Good, the Bad, and the Ugly: Predicting Aesthetic Image Labels by Wu, Yaowen; Bauckhage, Christian; Thurau, Christian is a scholarly article available to read on EtoBox.

Author

Wu, Yaowen; Bauckhage, Christian; Thurau, Christian

Publisher

IEEE

Published

2010