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About this Computer Science article
Pattern recognition methods for thermal drift correction in Atomic Force Microscopy imaging by M. D’Acunto; O. Salvetti is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- M. D’Acunto; O. Salvetti
- Publisher
- SP MAIK Nauka/Interperiodica; Pleiades Publishing; Pleiades Publishing Ltd (ISSN 1054-6618)
- Published
- 2011
- Language
- EN
- Field
- Computer Science (Physical Sciences)