About this Engineering article
A New Approach to Understanding Electromigration in Al(Cu) Alloys on an Atomistic Basis by Schmidt, C.; Dekker, J.P.; Gumbsch, P.; Arzt, E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Schmidt, C.; Dekker, J.P.; Gumbsch, P.; Arzt, E.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd (ISSN 1662-9507)
- Published
- 2001
- Field
- Engineering (Physical Sciences)