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Measurement and Correction of Instrumental Profiles for the Spectral Data of the New Vacuum Solar Telescope by Yunfang Cai; Zhi Xu; Kaifan Ji is a Physics and Astronomy article available to read on EtoBox.

What is Measurement and Correction of Instrumental Profiles for the Spectral Data of the New Vacuum Solar Telescope about?

The ideal optical system can realize point-to-point imaging, but for an actual observation it is difficult to achieve this ideal phenomenon due to the instrumental effects of imaging system, which is usually described as the instrument profile in the imaging process of a grating spectrometer. The existence of the spectrometer instrument profiles introduces systematic errors in the observed spectral lines, which make the spectrum of the studied objects degenerate and blur. In this paper, we take the spectral data in the Hα band observed by the Multi-Band Spectrometer (MBS) of the New Vacuum Solar Telescope (NVST) as an example; according to the characteristics of its acquired spectral data, we calculate the instrument profiles of the MBS in the spatial and the dispersion direction. The results are, respectively, 0.25 and 115 mÅ, which might reflect the influence of the MBS optical instruments at that time in the Hα band. Then the spectral data is deconvolved separately in the two directions by the corresponding IP to obtain the higher spatial and spectral resolution of the NVST spectral data.

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Author

Yunfang Cai; Zhi Xu; Kaifan Ji

Publisher

Springer; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC (ISSN 0038-0938)

Published

2020

Language

EN

Field

Physics and Astronomy (Physical Sciences)