About this scholarly article

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A novel method to characterize the dielectric and interfacial properties of Ba/sub 0.5/Sr/sub 0.5/TiO/sub 3/ (BST)/Si by microwave measurement by Hang-Ting Lue, ; Tseung-Yuen Tseng, ; Guo-Wei Huang, is a scholarly article available to read on EtoBox.

Author

Hang-Ting Lue, ; Tseung-Yuen Tseng, ; Guo-Wei Huang,

Publisher

IEEE

Published

2002

Language

EN