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Brillouin Nonlinearity Characterizations of a High Refractive Index Silicon Oxynitride Platform by Ye, Kaixuan; Keloth, Akshay; Klaver, Yvan; Baldazzi, Alessio; Piccoli, Gioele; Sanna, Matteo; Pavesi, Lorenzo; Ghulinyan, Mher; Marpaung, David is a scholarly article available to read on EtoBox.

What is Brillouin Nonlinearity Characterizations of a High Refractive Index Silicon Oxynitride Platform about?

Silicon oxynitride (SiON) is a low-loss and versatile material for linear and nonlinear photonics applications. Controlling the oxygen-to-nitrogen (O/N) ratio in SiON provides an effective way to engineer its optical and mechanical properties, making it a great platform for the investigation of on-chip optomechanical interactions, especially the stimulated Brillouin scattering (SBS). Here we report the Brillouin nonlinearity characterization of a SiON platform with a specific O/N ratio (characterized by a refractive index of $n=1.65$). First, we introduce this particular SiON platform with fabrication details. Subsequently, we discuss various techniques for the on-chip Brillouin nonlinearity characterizations. In particular, we focus on the intensity-modulated pump-probe lock-in amplifier technique, which enables ultra-sensitive characterization. Finally, we analyze the Brillouin nonlinearities of this SiON platform and compare them with other SiON platforms. This work underscores the potential of SiON for on-chip Brillouin-based applications. Moreover, it paves the way for Brillouin nonlinearity characterization across various material platforms.

Author

Ye, Kaixuan; Keloth, Akshay; Klaver, Yvan; Baldazzi, Alessio; Piccoli, Gioele; Sanna, Matteo; Pavesi, Lorenzo; Ghulinyan, Mher; Marpaung, David

Published

2024

Language

EN