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Can I read Illite-smectite mixed-layer minerals in the hydrothermal alteration of volcanic rocks: I. One-dimensional XRD structure analysis and characterization of component layers on EtoBox?

Illite-smectite mixed-layer minerals in the hydrothermal alteration of volcanic rocks: I. One-dimensional XRD structure analysis and characterization of component layers by Atsuyuki Inoue; Bruno Lanson; Maria Marques-Fernandes; Boris A. Sakharov; Takashi Murakami; Alain Meunier; Daniel Beaufort is a Materials Science article available to read on EtoBox.

What is Illite-smectite mixed-layer minerals in the hydrothermal alteration of volcanic rocks: I. One-dimensional XRD structure analysis and characterization of component layers about?

For aseries of mixed-layer illite-smectite (I-S) minerals from a drillhole near the Kakkonda geothermal field, one-dimensional structure analysis by X-ray diffraction (XRD) was performed using Casaturated specimens in both air-dried and ethylene glycol-solvated states. The expandability characteristics of component layers were also examined by means of alkylammonium exchange and Li saturation. The K content in the illite layers was 1.5-1.7/020(OH)4 in the I-S series from 3 to 85% ofI-layer content (% I). The layer charge of the smectite layer varied slightly within the range of 0.3-0.5/01O(OHh by alkylammonium exchange experiments and the expandability was independent of the beidellite content within a range of 0-0.5 by the Li-saturation test. The degree of long-range ordering represented by Reichweite (R) parameters varied from RO to R3 via Rl and R2 with increase in % I. The I-S sampies contained Rl I-S sampies showed complicated expandability with alkylammonium exchange. The XRD patterns of dodecylammonium-exchanged I-S sampies can be interpreted by random interstratification of several types of sub-units such as layer-doublets, layer-triplets and layer-quartets present in the

Who reads Illite-smectite mixed-layer minerals in the hydrothermal alteration of volcanic rocks: I. One-dimensional XRD structure analysis and characterization of component layers?

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Atsuyuki Inoue; Bruno Lanson; Maria Marques-Fernandes; Boris A. Sakharov; Takashi Murakami; Alain Meunier; Daniel Beaufort
Publisher
GeoScienceWorld; Springer-Verlag; The Clay Minerals Society; Springer Science and Business Media LLC; Clay Minerals Society; Springer Nature (ISSN 0009-8604)
Published
2005
Language
EN
Field
Materials Science (Physical Sciences)