About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Three-dimensional topography measurement with triangular beam scanning technique by Jiang, Jianfeng; He, Yonghui; Zhao, Wansheng; Chen, Philip T. C.; Gu, Zu-Han; Maradudin, Alexei A. is a scholarly article available to read on EtoBox.

Author

Jiang, Jianfeng; He, Yonghui; Zhao, Wansheng; Chen, Philip T. C.; Gu, Zu-Han; Maradudin, Alexei A.

Publisher

SPIE

Published

1999