About this scholarly article

Influence of Fine Roughness of Insulator Surface on Threshold Voltage Stability of Organic Field-effect Transistors by Suemori, Kouji; Uemura, Sei; Yoshida, Manabu; Hoshino, Satoshi; Takada, Noriyuki; Kodzasa, Takehito; Kamata, Toshihide is a scholarly article available to read on EtoBox.

Author

Suemori, Kouji; Uemura, Sei; Yoshida, Manabu; Hoshino, Satoshi; Takada, Noriyuki; Kodzasa, Takehito; Kamata, Toshihide

Publisher

American Institute of Physics; AIP Publishing (ISSN 0003-6951)

Published

2008

Language

EN