About this scholarly article

2008 IEEE International Conference on Computer Design - CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework by Pellegrini, Andrea; Constantinides, Kypros; Dan Zhang, ; Sudhakar, Shobana; Bertacco, Valeria; Austin, Todd is a scholarly article available to read on EtoBox.

Author

Pellegrini, Andrea; Constantinides, Kypros; Dan Zhang, ; Sudhakar, Shobana; Bertacco, Valeria; Austin, Todd

Publisher

IEEE

Published

2008