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About this Engineering article
720. Circuit design and parameters in thin film technology: F. F. Jennym, Electron. Reliability & Micromin., 2 (1), Jan./ March 1963, 19–26 is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0042-207X)
- Published
- 1963
- Language
- EN
- Field
- Engineering (Physical Sciences)