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About this Engineering article
Long-term NBTI degradation under real-use conditions in IBM microprocessors by Lu, Pong-Fei; Jenkins, Keith A.; Webel, Tobias; Marquardt, Oliver; Schubert, Birgit is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lu, Pong-Fei; Jenkins, Keith A.; Webel, Tobias; Marquardt, Oliver; Schubert, Birgit
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)