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About this Engineering article
Optical Models for the Ellipsometric Characterisation of Porous Silicon Structures by P. Petrik; É. Vázsonyi; M. Fried; J. Volk; G. T. Andrews; A. L. Tóth; Cs. S. Daróczi; I. Bársony; J. Gyulai is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- P. Petrik; É. Vázsonyi; M. Fried; J. Volk; G. T. Andrews; A. L. Tóth; Cs. S. Daróczi; I. Bársony; J. Gyulai
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Wiley (ISSN 1862-6351)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)