About this scholarly article

2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop - A Concurrent Testing Technique for Analog-to-Digital Converters by Geurkov, Vadim; Kirischian, Lev is a scholarly article available to read on EtoBox.

Author

Geurkov, Vadim; Kirischian, Lev

Publisher

IEEE

Published

2011