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About this Engineering article
Cathodoluminescence measurement of an orientation dependent aluminum concentration in AlxGa1−xAs epilayers grown by molecular beam epitaxy on a nonplanar substrate by Hoenk, Michael E.; Chen, Howard Z.; Yariv, Amnon; Morkoç, Hadis; Vahala, Kerry J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hoenk, Michael E.; Chen, Howard Z.; Yariv, Amnon; Morkoç, Hadis; Vahala, Kerry J.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1989
- Field
- Engineering (Physical Sciences)