About this scholarly article

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Low-trigger ESD protection design with latch-up immunity for 5-V CMOS application by drain engineering by Chiang, Chun; Chang, Ping-Chen; Chao, Mei-Ling; Tang, Tien-Hao; Su, Kuan-Cheng; Ker, Ming-Dou is a scholarly article available to read on EtoBox.

Author

Chiang, Chun; Chang, Ping-Chen; Chao, Mei-Ling; Tang, Tien-Hao; Su, Kuan-Cheng; Ker, Ming-Dou

Publisher

IEEE

Published

2017