About this scholarly article

2006 IEEE International Test Conference - Embedded Memory Diagnosis: An Industrial Workflow by Appello, Davide; Tancorre, Vincenzo; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; Reorda, Matteo is a scholarly article available to read on EtoBox.

Author

Appello, Davide; Tancorre, Vincenzo; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; Reorda, Matteo

Publisher

IEEE

Published

2006