About this scholarly article

2019 IEEE Latin American Test Symposium (LATS) - Mixed-level identification of fault redundancy in microprocessors by Oyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan is a scholarly article available to read on EtoBox.

Author

Oyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan

Publisher

IEEE

Published

2019

Language

EN