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About this Materials Science article
Amient-induced defect states at a-Si:H/ITO interfaces by Martin Hoheisel; Norbert Brutscher; Herfried Wieczorek is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Martin Hoheisel; Norbert Brutscher; Herfried Wieczorek
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-3093)
- Published
- 1989
- Field
- Materials Science (Physical Sciences)
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