About this scholarly article

2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference - High-resolution rapidly-swept widely-tunable Mid-IR spectrometer for industrial process control by Bamford, Douglas J.; Cook, David J.; Sharpe, Scott J.; Van Pelt, Aaron is a scholarly article available to read on EtoBox.

Author

Bamford, Douglas J.; Cook, David J.; Sharpe, Scott J.; Van Pelt, Aaron

Publisher

IEEE

Published

2006

Language

EN