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About this Materials Science article
Structure and Optical Properties of Ferroelectric PbZr 0.40 Ti 0.60 O 3 Films Grown on LaNiO 3 −Coated Platinized Silicon Determined by Infrared Spectroscopic Ellipsometry by Hu, Z. G.; Li, Y. W.; Zhu, M.; Zhu, Z. Q.; Chu, J. H. is a Materials Science article available to read on EtoBox.
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- Author
- Hu, Z. G.; Li, Y. W.; Zhu, M.; Zhu, Z. Q.; Chu, J. H.
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1932-7447)
- Published
- 2008
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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