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About this Engineering article
The Parametric Yield Enhancement of Integrated Circuits by Miran Singha; Robert Spence is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Miran Singha; Robert Spence
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0098-9886)
- Published
- 1991
- Language
- EN
- Field
- Engineering (Physical Sciences)