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About this Physics and Astronomy article
AIP Conference Proceedings - Examination of Critical Length Effect in Copper Interconnects With Oxide and Low-k Dielectrics by Thrasher, Stacye is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Thrasher, Stacye
- Publisher
- AIP
- Published
- 2004
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)