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About this Engineering article
Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors by Andreev, Boris A.; Ikonnikov, V.B.; Koslov, E.B.; Lifshits, T.M.; Shmagin, V.B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Andreev, Boris A.; Ikonnikov, V.B.; Koslov, E.B.; Lifshits, T.M.; Shmagin, V.B.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 1994
- Field
- Engineering (Physical Sciences)
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