About this scholarly article

2007 50th Midwest Symposium on Circuits and Systems - Probabilistic leakage power estimation of Partially-Depleted Silicon-On-Insulator (SOI) gates by Kyung Ki Kim, ; Yong-Bin Kim, is a scholarly article available to read on EtoBox.

Author

Kyung Ki Kim, ; Yong-Bin Kim,

Publisher

IEEE

Published

2007

Language

EN